Search results for: Yi Lin
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 897 - 901
2013 IEEE International Reliability Physics Symposium (IRPS) > ME.1.1 - ME.1.4
2010 International Electron Devices Meeting > 36.2.1 - 36.2.4
IEEE Transactions on Circuits and Systems I: Regular Papers > 2007 > 54 > 11 > 2552 - 2563